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Automated derivation of NoC Communication Specifications from Application Constraints., , , и . SiPS, стр. 238-243. IEEE, (2006)Programmable extended SEC-DED codes for memory errors., , , и . VTS, стр. 140-145. IEEE Computer Society, (2011)Memory reliability improvements based on maximized error-correcting codes., , и . European Test Symposium, стр. 1-6. IEEE Computer Society, (2012)Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection., , , , и . DATE, стр. 1077-1082. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Programmable restricted SEC codes to mask permanent faults in semiconductor memories., , и . IOLTS, стр. 147-153. IEEE Computer Society, (2010)System-level hardware-based protection of memories against soft-errors., , , , и . DATE, стр. 1222-1225. IEEE, (2009)Error Correction Schemes with Erasure Information for Fast Memories., , и . J. Electron. Test., 30 (2): 183-192 (2014)Shadow-scan design with low latency overhead and in-situ slack-time monitoring., , , , , , и . ETS, стр. 1-6. IEEE, (2014)Error prediction based on concurrent self-test and reduced slack time., , , , и . DATE, стр. 1626-1631. IEEE, (2011)Error-correction schemes with erasure information for fast memories., и . ETS, стр. 1-6. IEEE Computer Society, (2013)