( en | de | ru )

 

Disambiguation of "Hicks, Jeffery"

Author of the publication

copydeleteadd this publication to your clipboard
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits.

, , , , , , , , , and . IRPS, page 1-5. IEEE, (2020)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Robert Hicks

William Hicks

Birgit Hickstein

Magnetic beads for bioseparation processes - synthesis and application properties. TU Clausthal-Zellerfeld, (2009)

Mirja Hickstein

Ronald Hicks

 

Other publications of authors with the same name

Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced process nodes., , , , , , , , and . IRPS, page 1-8. IEEE, (2023)Transistor reliability variation correlation to threshold voltage., , , , , and . IRPS, page 3. IEEE, (2015)Intel PowerVia Technology: Backside Power Delivery for High Density and High-Performance Computing., , , , , , , , , and 52 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits., , , , , , , , , and . IRPS, page 1-5. IEEE, (2020)Reliability of dual-damascene local interconnects featuring cobalt on 10 nm logic technology., , , , , , , , , and 4 other author(s). IRPS, page 6. IEEE, (2018)Learn Windows PowerShell in a month of lunches, and . Manning, Shelter Island, New York, (2017)Reliability Characteristics of a High Density Metal- Insulator-Metal Capacitor on Intel's 10+ Process., , , , , , , , , and 6 other author(s). IRPS, page 1-4. IEEE, (2020)E-Core Implementation in Intel 4 with PowerVia (Backside Power) Technology., , , , , , , , , and 82 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)Novel Cell Architectures with Back-side Transistor Contacts for Scaling and Performance., , , , , , , , , and 22 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)