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MC framework: High-performance distributed framework for standalone data analysis packages over Hadoop-based cloud.

, , , and . GrC, page 27-32. IEEE Computer Society, (2013)

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A Virtual Metrology Scheme for Predicting CVD Thickness in Semiconductor Manufacturing., , , and . ICRA, page 1054-1059. IEEE, (2006)A secure collaborative e-diagnostics framework for semiconductor factories., , , , , and . CASE, page 185-190. IEEE, (2005)A ZigBee indoor positioning scheme using signal-index-pair data preprocess method to enhance precision., , , and . ICRA, page 548-553. IEEE, (2010)Fuzzy-scheduling integral control of induction servo motor with actuator saturation via LMI approach., , , and . Int. J. Comput. Appl. Technol., 27 (2/3): 107-118 (2006)An Intelligent Factory Automation System With Multivariate Time Series Algorithm for Chip Probing Process., , , , , , , and . IEEE Robotics Autom. Lett., 8 (9): 5464-5471 (September 2023)Special Issue on Automation Analytics Beyond Industry 4.0: From Hybrid Strategy to Zero-Defect Manufacturing., , , , , and . IEEE Trans Autom. Sci. Eng., 19 (3): 1472-1476 (2022)A Novel Implementation Framework of Digital Twins for Intelligent Manufacturing Based on Container Technology and Cloud Manufacturing Services., , , , , , , , , and 1 other author(s). IEEE Trans Autom. Sci. Eng., 19 (3): 1614-1630 (2022)Expandable-Convolutional-Block Neural Inference with Spatial-Fused Multi-resolution Features and Terse Convolution for IoT-Based Intelligent Automated Systems., , , , , , , and . ACIIDS (Companion), volume 1716 of Communications in Computer and Information Science, page 276-286. Springer, (2022)Quad-Partitioning-Based Robotic Arm Guidance Based on Image Data Processing with Single Inexpensive Camera For Precisely Picking Bean Defects in Coffee Industry., , , , , , , , , and 2 other author(s). ACIIDS (2), volume 11432 of Lecture Notes in Computer Science, page 152-164. Springer, (2019)Development of a private cloud-based new-generation virtual metrology system., , , , and . CASE, page 910-915. IEEE, (2014)