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Disambiguation of "Chini, Alessandro"

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On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs.

, , , , , , , , , , , , , , , , and . Microelectron. Reliab., (2018)

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Rolf Chini

Ioanna Chini

Camil Chiniara

Alessandro Valeri

Fluorescence resonance energy transfer between multiple chromophores studied by single-molecule spectroscopy. Uni Düsseldorf, (2009)

Alessandro Mirizzi

 

Other publications of authors with the same name

A novel GaN HEMT degradation mechanism observed during HTST test., , , and . IRPS, page 4-1. IEEE, (2018)Evidence of Carbon Doping Effect on VTH Drift and Dynamic-RON of 100V p-GaN Gate AlGaN/GaN HEMTs., , , , , , , and . IRPS, page 1-5. IEEE, (2023)Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress., , , , , , and . Microelectron. Reliab., 50 (9-11): 1523-1527 (2010)Effects of buffer compensation strategies on the electrical performance and RF reliability of AlGaN/GaN HEMTs., , , , , , , , , and 7 other author(s). Microelectron. Reliab., 55 (9-10): 1662-1666 (2015)Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs., , , , , , , , and . IRPS, page 5. IEEE, (2022)Field plate related reliability improvements in GaN-on-Si HEMTs., , , , , , , , and . Microelectron. Reliab., 52 (9-10): 2153-2158 (2012)Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs., , , , , , , and . IRPS, page 1-5. IEEE, (2020)A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps., , and . ESSDERC, page 372-375. IEEE, (2022)On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs., , , , , , , , , and 7 other author(s). Microelectron. Reliab., (2018)Reliability Investigation of GaN HEMTs for MMICs Applications., , , , and . Micromachines, 5 (3): 570-582 (2014)