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Disambiguation of "Balado, Luz"

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Lissajous Based Mixed-Signal Testing for N-Observable Signals.

, , , , and . DDECS, page 125-130. IEEE Computer Society, (2006)

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Luz Dambowy

Gerhard Luz

Gerhard Luz

Luz Lewin

Wolfgang Luz

 

Other publications of authors with the same name

Test Engineering Education in Europe: the EuNICE-Test Project., , , , , , , , , and 1 other author(s). MSE, page 85-86. IEEE Computer Society, (2003)Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ., , , , , , , , , and . DELTA, page 135-139. IEEE Computer Society, (2004)Efficient Production Binning Using Octree Tessellation in the Alternate Measurements Space., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (8): 1386-1395 (2016)Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours., , , and . J. Electron. Test., 20 (2): 143-153 (2004)Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours., , , and . IOLTW, page 99-103. IEEE Computer Society, (2002)BIST Technique by Equally Spaced Test Vector Sequences., , , , , , and . VTS, page 206-216. IEEE Computer Society, (2004)On the selection of efficient arithmetic additive test pattern generators logic test., , , , , , and . ETW, page 9-14. IEEE Computer Society, (2003)M-S specification binning based on digitally coded indirect measurements., , and . ETS, page 1-6. IEEE, (2014)Indirect test of M-S circuits using multiple specification band guarding., , and . Integr., (2016)On High-Quality, Low Energy BIST Preparation at RT-Level., , , , , and . LATW, page 52-57. IEEE, (2002)