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Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments.

A. Yan, Z. Li, J. Cui, Z. Huang, T. Ni, P. Girard, и X. Wen. IEEE Trans. Aerosp. Electron. Syst., 59 (3): 2885-2897 (июня 2023)

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Zhengfeng Zhang

Zhengfeng Qian

Josef Huang

Pa Huang

Haishi Huang

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Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications.A. Yan, Z. Fan, L. Ding, J. Cui, Z. Huang, Q. Wang, H. Zheng, P. Girard, и X. Wen. IEEE Trans. Aerosp. Electron. Syst., 58 (1): 517-529 (2022)Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications.A. Yan, J. Xiang, Y. Chang, Z. Huang, J. Cui, P. Girard, и X. Wen. Microelectron. J., (сентября 2023)Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.T. Ni, J. Bian, Z. Yang, M. Nie, L. Yao, Z. Huang, A. Yan, и X. Wen. IEEE Des. Test, 39 (5): 34-42 (2022)A High-Performance and P-Type FeFET-Based Non-Volatile Latch.A. Yan, Y. Chen, Z. Huang, J. Cui, и X. Wen. ATS, стр. 1-5. IEEE, (2023)A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells.Z. Song, A. Yan, J. Cui, Z. Chen, X. Li, X. Wen, C. Lai, Z. Huang, и H. Liang. ITC-Asia, стр. 139-144. IEEE, (2019)Design of Low-Cost Approximate CMOS Full Adders.A. Yan, S. Wei, Z. Li, J. Cui, Z. Huang, P. Girard, и X. Wen. ISCAS, стр. 1-5. IEEE, (2023)A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs.H. Liang, D. Li, Z. Yang, T. Ni, Z. Huang, и C. Jiang. ITC-Asia, стр. 1-5. IEEE, (2021)A high performance SEU-tolerant latch for nanoscale CMOS technology.Z. Huang. DATE, стр. 1-5. European Design and Automation Association, (2014)A self-training end-to-end mask optimization framework based on semantic segmentation network.H. Xu, F. Tang, P. Qi, Y. Yuan, H. Liang, и Z. Huang. Integr., (2024)Design of Wireless Network on Chip with Priority-Based MAC.Y. Ouyang, Y. Zhao, K. Xing, Z. Huang, H. Liang, и J. Li. J. Circuits Syst. Comput., 28 (8): 1950124:1-1950124:18 (2019)

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