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Disambiguation of "Kanj, Rouwaida"

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Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction.

, , , , , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (3): 534-543 (2015)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mahmoud Kanj

Ali Kanj

Rouwaida Abdallah

Sawsan Kanj

Matthieu Kanj

 

Other publications of authors with the same name

A Disturb Decoupled Column Select 8T SRAM Cell., , and . CICC, page 25-28. IEEE, (2007)Yield estimation via multi-cones., , , , and . DAC, page 1107-1112. ACM, (2012)A critical look at design guidelines for SOI logic gates., and . ISCAS (3), page 261-264. IEEE, (2002)A floating-body dynamic supply boosting technique for low-voltage sram in nanoscale PD/SOI CMOS technologies., , , , and . ISLPED, page 8-13. ACM, (2007)Efficient Analog CAM Design., , , , and . CoRR, (2022)Double error cellular automata-based error correction with skip-mode compact syndrome coding for resilient PUF design., , , , , , and . ISQED, page 413-418. IEEE, (2018)SRAM Local Bit Line Access Failure Analyses., , , , , and . ISQED, page 204-209. IEEE Computer Society, (2006)An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects., , , , and . ICCAD, page 497-504. ACM, (2009)Universal statistical cure for predicting memory loss., , , and . ICCAD, page 236-239. IEEE Computer Society, (2011)Hybrid Importance Splitting Importance Sampling Methodology for Fast Yield Analysis of Memory Designs., , and . ISCAS, page 1-5. IEEE, (2020)