Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction.

R. Joshi, K. Kim, R. Kanj, A. Bhoj, M. Ziegler, P. Oldiges, P. Kerber, R. Wong, T. Hook, S. Saroop, C. Radens, and C. Yeh. IEEE Trans. Very Large Scale Integr. Syst., 23 (3): 534-543 (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Birgit Hook

Sandra Hook

Heinrich Hook

Walter Hook

Terence Shaw

Other publications of authors with the same name

Scalability of planar FDSOI and FinFETs and What's in store for the future beyond that?B. Doris, and T. Hook. ESSDERC, page 160-163. IEEE, (2015)Estimation of Iddq for early chip and technology design decisions.T. Hook, L. Wissel, and D. Mazgaj. CICC, page 627-630. IEEE, (2003)Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction.R. Joshi, K. Kim, R. Kanj, A. Bhoj, M. Ziegler, P. Oldiges, P. Kerber, R. Wong, T. Hook, S. Saroop and 2 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 23 (3): 534-543 (2015)Ultralow-power SRAM technology.R. Mann, W. Abadeer, M. Breitwisch, O. Bula, J. Brown, B. Colwill, P. Cottrell, W. Jr., S. Furkay, M. Hauser and 12 other author(s). IBM J. Res. Dev., 47 (5-6): 553-566 (2003)Plasma process-induced damage on thick (6.8 nm) and thin (3.5 nm) gate oxide: parametric shifts, hot-carrier response, and dielectric integrity degradation.T. Hook, D. Harmon, and C. Lin. Microelectron. Reliab., 41 (5): 751-765 (2001)Enchanced multi-threshold (MTCMOS) circuits using variable well bias.S. Kosonocky, M. Immediato, P. Cottrell, T. Hook, R. Mann, and J. Brown. ISLPED, page 165-169. ACM, (2001)Fully depleted devices for designers: FDSOI and FinFETs.T. Hook. CICC, page 1-7. IEEE, (2012)Automatic extraction of circuit models from layout artwork for a BiCMOS technology.T. Hook. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 11 (6): 732-738 (1992)Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration.T. Hook, R. Bolam, W. Clark, J. Burnham, N. Rovedo, and L. Schutz. Microelectron. Reliab., 45 (1): 47-56 (2005)Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations.T. Hook, J. Burnham, and R. Bolam. IBM J. Res. Dev., 43 (3): 393-406 (1999)

BibSonomy

Disambiguation of "Hook, Terence"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction.

Please choose a person to relate this publication to

Birgit Hook

Sandra Hook

Heinrich Hook

Walter Hook

Terence Shaw

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Hook, Terence"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction.

Please choose a person to relate this publication to

Birgit Hook

Sandra Hook

Heinrich Hook

Walter Hook

Terence Shaw

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction.