From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

ESD protection diodes in optical interposer technology., , , , , , и . ICICDT, стр. 1-4. IEEE, (2015)ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology., , , , и . ESSDERC, стр. 194-197. IEEE, (2018)Processing active devices on Si interposer and impact on cost., , , , , , , , , и . 3DIC, стр. TS11.2.1-TS11.2.4. IEEE, (2015)Reliability challenges in Forksheet Devices: (Invited Paper)., , , , , , , , , и 2 other автор(ы). IRPS, стр. 1-8. IEEE, (2023)Physics-based device aging modelling framework for accurate circuit reliability assessment., , , , , , , , , и . IRPS, стр. 1-6. IEEE, (2021)Self-heating-aware CMOS reliability characterization using degradation maps., , , , , , , и . IRPS, стр. 2. IEEE, (2018)Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps., , , , , , и . IRPS, стр. 5. IEEE, (2018)Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown., , , , , , , , , и 1 other автор(ы). IRPS, стр. 5-1. IEEE, (2018)Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices., , , , , , , , , и 6 other автор(ы). IRPS, стр. 1-8. IEEE, (2019)A Pragmatic Model to Predict Future Device Aging., , , , , , , , , и 1 other автор(ы). IEEE Access, (2023)