Author of the publication

Bayesian Approach for Two-Phase Degradation Data Based on Change-Point Wiener Process With Measurement Errors.

, , , and . IEEE Trans. Reliab., 67 (2): 688-700 (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices., , , and . IEEE Trans. Reliability, 56 (3): 392-400 (2007)Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects., , and . IEEE Access, (2019)A Bayesian approach to modeling two-phase degradation using change-point regression., , , and . Reliab. Eng. Syst. Saf., (2015)A Step-Down Test Procedure for Wavelet Shrinkage Using Bootstrapping., , and . IEEE Access, (2020)Bayesian Approach for Two-Phase Degradation Data Based on Change-Point Wiener Process With Measurement Errors., , , and . IEEE Trans. Reliab., 67 (2): 688-700 (2018)A Genetic-Based Iterative Quantile Regression Algorithm for Analyzing Fatigue Curves., , and . Quality and Reliability Eng. Int., 28 (8): 897-909 (2012)Mixed-Effects Nonhomogeneous Poisson Process Model for Multiple Repairable Systems., , and . IEEE Access, (2021)A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns., , and . Reliab. Eng. Syst. Saf., (2016)A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides., , and . IEEE Trans. Reliability, 65 (1): 263-271 (2016)Generalized Linear Mixed Models for Reliability Analysis of Multi-Copy Repairable Systems., , and . IEEE Trans. Reliability, 56 (1): 106-114 (2007)