From post

Particle Swarm Optimization Based BIST Design for Memory Cores in Mesh Based Network-on-Chip.

, , , и . VDAT, том 7373 из Lecture Notes in Computer Science, стр. 343-349. Springer, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Customizing pattern set for test power reduction via improved X-identification and reordering., , , и . ISLPED, стр. 177-182. ACM, (2010)Particle Swarm Optimization Based BIST Design for Memory Cores in Mesh Based Network-on-Chip., , , и . VDAT, том 7373 из Lecture Notes in Computer Science, стр. 343-349. Springer, (2012)A Metric for Test Set Characterization and Customization Toward Fault Diagnosis., , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (11): 1824-1828 (2013)A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing., , и . ICIIS, стр. 1-6. IEEE, (2008)Post-Silicon Validation and Diagnosis., и . VLSID, стр. 9-10. IEEE Computer Society, (2016)Fault diagnosis in designs with extreme low pin test data compressors., , и . DATE, стр. 1285-1288. ACM, (2015)Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing., , и . Asian Test Symposium, стр. 25-30. IEEE Computer Society, (2013)Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 696-700 (2014)A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection., , , и . VLSI Design, стр. 436-441. IEEE Computer Society, (2012)Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption., , и . Asian Test Symposium, стр. 307-312. IEEE Computer Society, (2009)