( en | de | ru )

 

Disambiguation of "Cheng, Fan-Tien"

Author of the publication

copydeleteadd this publication to your clipboard
A Novel Efficient Big Data Processing Scheme for Feature Extraction in Electrical Discharge Machining.

, , , , , , and . IEEE Robotics Autom. Lett., 4 (2): 910-917 (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Cheng Fan

Fan Cheng

Tien-mu Cheng

Cheng-Tien Chiang

Yuh-Cheng Fan

 

Other publications of authors with the same name

A secure collaborative e-diagnostics framework for semiconductor factories., , , , , and . CASE, page 185-190. IEEE, (2005)Implementation Considerations of Various Virtual Metrology Algorithms., , , and . CASE, page 276-281. IEEE, (2007)Time Series Prediction Algorithm for Intelligent Predictive Maintenance., , , , and . IEEE Robotics Autom. Lett., 4 (3): 2807-2814 (2019)Development of holonic information coordination systems with failure-recovery considerations., , and . IEEE Trans Autom. Sci. Eng., 1 (1): 58-72 (2004)Developing an Automatic Virtual Metrology System., , and . IEEE Trans Autom. Sci. Eng., 9 (1): 181-188 (2012)Development of a system framework for the computer-integrated manufacturing execution system: a distributed object-oriented approach., , , and . Int. J. Computer Integrated Manufacturing, 12 (5): 384-402 (1999)Preliminary study of an intelligent sampling decision scheme for the AVM system., , , and . ICRA, page 3496-3501. IEEE, (2014)Development of a dual-stage virtual metrology architecture for TFT-LCD manufacturing., , , and . ICRA, page 3630-3635. IEEE, (2008)A Virtual Metrology Scheme for Predicting CVD Thickness in Semiconductor Manufacturing., , , and . ICRA, page 1054-1059. IEEE, (2006)Application Cluster Service Scheme for Near-Zero-Downtime Services., , , , and . ICRA, page 4062-4067. IEEE, (2005)