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Disambiguation of "de la Rosa, Francisco López"

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Training industrial engineers in Logistics 4.0.

, , , , , and . Comput. Ind. Eng., (October 2023)

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Francisco López-Casero

Francisco Javier Peula López

Francisco Javier López Villanueva

Jonatan Núñez-de la Rosa

Francisco Asís López Fuentes

 

Other publications of authors with the same name

Defect detection and classification on semiconductor wafers using two-stage geometric transformation-based data augmentation and SqueezeNet lightweight convolutional neural network., , , , and . Comput. Ind. Eng., (September 2023)Feeling of Safety and Comfort towards a Socially Assistive Unmanned Aerial Vehicle That Monitors People in a Virtual Home., , , , , and . Sensors, 21 (3): 908 (2021)Training industrial engineers in Logistics 4.0., , , , , and . Comput. Ind. Eng., (October 2023)Fine-Tuned SqueezeNet Lightweight Model for Classifying Surface Defects in Hot-Rolled Steel., , , , and . IWANN (1), volume 14134 of Lecture Notes in Computer Science, page 221-233. Springer, (2023)Artificial Vision Technique to Detect and Classify Cocoa Beans., , , , , , and . IWANN (2), volume 14135 of Lecture Notes in Computer Science, page 217-228. Springer, (2023)One-dimensional convolutional neural networks for low/high arousal classification from electrodermal activity., , , and . Biomed. Signal Process. Control., 71 (Part): 103203 (2022)Machine Learning Techniques for Arousal Classification from Electrodermal Activity: A Systematic Review., , , , and . Sensors, 22 (22): 8886 (2022)Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach., , , , and . IWINAC (1), volume 13259 of Lecture Notes in Computer Science, page 356-365. Springer, (2022)Feature and Time Series Extraction in Artificial Neural Networks for Arousal Detection from Electrodermal Activity., , , , and . IWANN (1), volume 12861 of Lecture Notes in Computer Science, page 265-276. Springer, (2021)Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network., , , , and . Expert Syst. Appl., (2022)