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Disambiguation of "Gómez-Sirvent, José Luis"

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Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach.

, , , , and . IWINAC (1), volume 13259 of Lecture Notes in Computer Science, page 356-365. Springer, (2022)

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José Gómez

María José Carrascosa Gómez

José Carlos Gómez Lebrón

José Jorge Gómez Izquierdo

José Luis Goity

 

Other publications of authors with the same name

Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach., , , , and . IWINAC (1), volume 13259 of Lecture Notes in Computer Science, page 356-365. Springer, (2022)Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network., , , , and . Expert Syst. Appl., (2022)Defect detection and classification on semiconductor wafers using two-stage geometric transformation-based data augmentation and SqueezeNet lightweight convolutional neural network., , , , and . Comput. Ind. Eng., (September 2023)Binary Classification Methods for Movement Analysis from Functional Near-Infrared Spectroscopy Signals., , , , , and . IWINAC, volume 14674 of Lecture Notes in Computer Science, page 401-410. Springer, (2024)Training industrial engineers in Logistics 4.0., , , , , and . Comput. Ind. Eng., (October 2023)Building information modeling and affective occupancy evaluation: A scoping review., , , and . J. Ambient Intell. Smart Environ., 16 (2): 155-166 (2024)Fine-Tuned SqueezeNet Lightweight Model for Classifying Surface Defects in Hot-Rolled Steel., , , , and . IWANN (1), volume 14134 of Lecture Notes in Computer Science, page 221-233. Springer, (2023)VRPrOE Toolbox for Virtual Pre-occupancy Evaluation: Proof of Concept on a BIM Model of a Conservatory Classroom., , , , and . ISAmI, volume 770 of Lecture Notes in Networks and Systems, page 189-198. Springer, (2023)Improved Surface Defect Classification from a Simple Convolutional Neural Network by Image Preprocessing and Data Augmentation., , , , , and . IWINAC (2), volume 14675 of Lecture Notes in Computer Science, page 23-32. Springer, (2024)A deep residual neural network for semiconductor defect classification in imbalanced scanning electron microscope datasets., , , , and . Appl. Soft Comput., (2022)