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Disambiguation of "Cardoso, LP"

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Using synchrotron radiation x-ray multiple diffraction to examine the lattice coherency of semiconductor surfaces and epitaxial layers

, , , , , , and . JOURNAL OF APPLIED PHYSICS, 79 (7): 3492-3498 (1996)
DOI: 10.1063/1.361399

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Ghendy Cardoso

Marcelo Cardoso

Dilson Cardoso

Jonas Cardoso

Jorge Cardoso

 

Other publications of authors with the same name

X-ray multiple diffraction in Renninger scanning mode: Simulation of data recorded using synchrotron radiation, , , , , , and . JOURNAL OF APPLIED CRYSTALLOGRAPHY, 29 (4): 325-330 (1996)THE SENSITIVITY OF RENNINGER SCAN INTENSITIES WITH A1 CONTENT IN GA1-XALXAS/GAAS SAMPLES, , and . DEFECT ENGINEERING IN SEMICONDUCTOR GROWTH, PROCESSING AND DEVICE TECHNOLOGY, volume 262 of MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, page 259-263. PITTSBURGH, FUJI XEROX; HITACHI; MAT RES SOC; CO APPLICAT MECAN ELECTR CINEMA ATOMIST; EASTMAN KODAK; ELECT POWER RES INST; FUJITSU; HUGHES RES LABS; JAPAN BROADCASTING; JAPAN ELECTR OPT LAB, MATERIALS RESEARCH SOC, (1992)SYMP ON DEFECT ENGINEERING IN SEMICONDUCTOR GROWTH, PROCESSING AND DEVICE TECHNOLOGY, AT THE 1992 SPRING MEETING OF THE MATERIALS RESEARCH SOC, SAN FRANCISCO, CA, APR 26-MAY 01, 1992.Habit modification of nearly perfect single crystals of potassium dihydrogen phosphate (KDP) by trivalent manganese ions studied using synchrotron radiation X-ray multiple diffraction in Renninger scanning mode, , , , and . JOURNAL OF APPLIED CRYSTALLOGRAPHY, 36 (5): 1230-1235 (2003)Structure of habit-modifying trivalent transition metal cations (Mn3+, Cr3+) in nearly perfect single crystals of potassium dihydrogen phosphate as examined by X-ray standing waves, X-ray absorption spectroscopy, and molecular modeling, , , , , and . CHEMISTRY OF MATERIALS, 17 (16): 4053-4061 (2005)Using synchrotron radiation x-ray multiple diffraction to examine the lattice coherency of semiconductor surfaces and epitaxial layers, , , , , , and . JOURNAL OF APPLIED PHYSICS, 79 (7): 3492-3498 (1996)X-ray multiple diffraction as a probe to determine all the pieioelectric coefficients of a crystal: Rochelle salt case, , , , and . JOURNAL OF PHYSICS-CONDENSED MATTER, 15 (46): 7835-7842 (2003)Piezoelectric coefficients of L-arginine hydrochloride monohydrate obtained by X-ray multiple diffraction using synchrotron radiation, , , , , , , , and . JOURNAL OF APPLIED CRYSTALLOGRAPHY, 36 (6): 1348-1351 (2003)HYBRID MULTIPLE DIFFRACTION IN RENNINGER SCAN FOR HETEROEPITAXIAL LAYERS, , , and . JOURNAL OF APPLIED PHYSICS, 70 (5): 2589-2593 (1991)Sensitivity of Bragg surface diffraction to analyze ion-implanted semiconductors, , , , , , and . APPLIED PHYSICS LETTERS, 71 (18): 2614-2616 (1997)Synchrotron radiation multiple diffraction study of Al0.304Ga0.172In0.524As MOVPE grown onto InP(001), , , , , , and . JOURNAL OF CRYSTAL GROWTH, 172 (3-4): 284-290 (1997)