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Selecting the most relevant structural Fmax for system Fmax correlation.

, , , , and . VTS, page 99-104. IEEE Computer Society, (2010)

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Defect-Oriented Testing and Defective-Part-Level Prediction., , , , , , , and . IEEE Des. Test Comput., 18 (1): 31-41 (2001)Test Generation Based on High-Level Assertion Specification for PowerPCTM Microprocessor Embedded Arrays., and . J. Electron. Test., 13 (2): 121-135 (1998)Multilevel circuit clustering for delay minimization., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (7): 1073-1085 (2004)Using 2-domain partitioned OBDD data structure in an enhanced symbolic simulator., , , and . ACM Trans. Design Autom. Electr. Syst., 10 (4): 627-650 (2005)Design trends and test challenges in automotive electronics.. VLSI-DAT, page 1. IEEE, (2014)Analog behavioral modeling flow using statistical learning method., , , and . ISQED, page 872-878. IEEE, (2010)On evaluating speed path detection of structural tests., , , , and . ISQED, page 570-576. IEEE, (2010)Verification and Validation of Complex Digital Systems: An Industrial Perspective., and . ISQED, page 11-12. IEEE Computer Society, (2001)Some considerations on choosing an outlier method for automotive product lines., , , , , and . ITC, page 1-10. IEEE, (2017)Experience in critical path selection for deep sub-micron delay test and timing validation., , , and . ASP-DAC, page 751-756. ACM, (2003)