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Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection.

, , , , and . J. Electron. Test., 35 (3): 367-381 (2019)

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Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)Reliability of computing systems: From flip flops to variables., , , , and . IOLTS, page 196-198. IEEE, (2017)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , and 1 other author(s). Microprocess. Microsystems, 39 (8): 1204-1214 (2015)Computing reliability: On the differences between software testing and software fault injection techniques., , , , , and . Microprocess. Microsystems, (2017)Towards approximation during test of Integrated Circuits., , , , , and . DDECS, page 28-33. IEEE, (2017)Synthesis of Finite State Machines on Memristor Crossbars., , , , , and . DDECS, page 107-112. IEEE, (2018)Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection., , , , and . J. Electron. Test., 35 (3): 367-381 (2019)Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator., , , , , and . DDECS, page 181-186. IEEE, (2023)AdequateDL: Approximating Deep Learning Accelerators., , , , , , and . DDECS, page 37-40. IEEE, (2021)Selective Hardening of Critical Neurons in Deep Neural Networks., , , , , and . DDECS, page 136-141. IEEE, (2022)