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Innovative practices session 4C: Disruptive solutions in the non-digital world.

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Test Metrics for Analog Parametric Faults., and . VTS, page 226-235. IEEE Computer Society, (1999)Mid-bond Interposer Wire Test., , , , and . Asian Test Symposium, page 153-158. IEEE Computer Society, (2013)The P1149.4 Mixed Signal Test Bus: Costs and Benefits.. ITC, page 444-450. IEEE Computer Society, (1995)BIST vs. ATE: need a different vehicle?. ITC, page 1148. IEEE Computer Society, (1998)Innovative practices session 4C: Disruptive solutions in the non-digital world., , , , and . VTS, page 1. IEEE Computer Society, (2014)Small delay testing for TSVs in 3-D ICs., , , , , , and . DAC, page 1031-1036. ACM, (2012)Innovative practices session 7C: Reduced pin-count testing - How low can we go?, , , and . VTS, page 1. IEEE Computer Society, (2014)How Should Fault Coverage Be Defined?, and . VTS, page 325-328. IEEE Computer Society, (2000)Design for testability of integrated operational amplifiers using oscillation-test strategy., , and . ICCD, page 40-45. IEEE Computer Society, (1996)Correct by construction is guaranteed to fail.. ITC, page 1. IEEE Computer Society, (2005)