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Accurate Leakage/Delay Estimation for FinFET Standard Cells under PVT Variations using the Response Surface Methodology., , and . JETC, 11 (2): 19:1-19:20 (2014)An Implementation Model for Collaborative Applications., and . CLEI Electron. J., (1998)Strictness Analysis of the Untyped lambda-Calculus.. Inf. Process. Lett., 28 (3): 121-125 (1988)Reasoning about Simple and Exhaustive Demand in Highter-Order Lazy Languages., and . FPCA, volume 523 of Lecture Notes in Computer Science, page 328-351. Springer, (1991)Accurate Leakage Estimation for FinFET Standard Cells Using the Response Surface Methodology., , and . VLSI Design, page 238-244. IEEE Computer Society, (2012)On the Power and Limitation of Strictness Analysis Based on Abstract Interpretation., , and . POPL, page 37-48. ACM Press, (1991)Evaluation of multiple supply and threshold voltages for low-power FinFET circuit synthesis., , and . NANOARCH, page 77-84. IEEE Computer Society, (2008)Die-level leakage power analysis of FinFET circuits considering process variations., , and . ISQED, page 347-355. IEEE, (2010)Low-power FinFET circuit synthesis using multiple supply and threshold voltages., , and . JETC, 5 (2): 7:1-7:23 (2009)On the power and limitations of strictness analysis., , and . J. ACM, 44 (3): 505-525 (1997)