( en | de | ru )

 

Disambiguation of "Kapur, Rohit"

Author of the publication

copydeleteadd this publication to your clipboard
IDDQ Test: Sensitivity Analysis of Scaling.

, , , , and . ITC, page 786-792. IEEE Computer Society, (1996)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Tina Kapur

Rohit Sinha

Aphrodite Kapurniotu

Malak Basheshar Kapur

Rohit Gupta

 

Other publications of authors with the same name

Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes., and . IEEE Trans. Computers, 41 (12): 1580-1588 (1992)Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment., , , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (7): 1185-1195 (2015)DFT MAX and Power., , , , , , , , , and 2 other author(s). J. Low Power Electron., 3 (2): 199-205 (2007)Speed Binning with Path Delay Test in 150-nm Technology., , and . IEEE Des. Test Comput., 20 (5): 41-45 (2003)An ATE assisted DFD technique for volume diagnosis of scan chains., , , and . DAC, page 31:1-31:6. ACM, (2013)Fast functional evaluation of candidate OBDD variable orderings., , , and . EURO-DAC, page 4-10. EEE Computer Society, (1991)Functional Approaches to Generating Orderings for Efficient Symbolic Representations., , and . DAC, page 624-627. IEEE Computer Society Press, (1992)A new methodology for improved tester utilization., , , , , and . ITC, page 916-923. IEEE Computer Society, (2001)Limitations in predicting defect level based on stuck-at fault coverage., , , , and . VTS, page 186-191. IEEE Computer Society, (1994)Manufacturing Test of SoCs., and . Asian Test Symposium, page 317-319. IEEE Computer Society, (2002)