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Maximizing scan pin and bandwidth utilization with a scan routing fabric., , , , , , and . ITC, page 1-10. IEEE, (2017)Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor., , and . IEEE Des. Test Comput., 26 (1): 52-59 (2009)Test access mechanism for multiple identical cores., , , , and . ITC, page 1-10. IEEE Computer Society, (2009)A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects., , and . DFT, page 460-468. IEEE Computer Society, (2004)Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults., , , , , and . DFT, page 177-185. IEEE Computer Society, (2002)Toward more efficient scan data bandwidth utilization on modern SOCs., , , , , , and . SoCC, page 64-68. IEEE, (2016)Test Access Mechanism for Multiple Identical Cores., , , , and . ITC, page 1-10. IEEE Computer Society, (2008)Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects., , , and . DATE, page 1066-1071. IEEE Computer Society, (2004)Function-Based Dynamic Compaction and its Impact on Test Set Sizes., , and . DFT, page 167-174. IEEE Computer Society, (2003)