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Disambiguation of "Kassab, Mark"

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At-speed scan test with low switching activity.

, , , and . VTS, page 177-182. IEEE Computer Society, (2010)

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Randa Kassab

Hisham Kassab

Talaat al- Kassab

Islam Yassin-Kassab

Tala'at Al-Kassab

 

Other publications of authors with the same name

Test Compression Improvement with EDT Channel Sharing in SoC Designs., , , , , , , and . NATW, page 22-31. IEEE, (2014)X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (1): 147-159 (2008)Efficient Test Compression Configuration Selection., , , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (7): 2323-2336 (2022)X-Press Compactor for 1000x Reduction of Test Data., , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs., , , , , , , , , and 3 other author(s). ITC, page 1-10. IEEE, (2020)EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism., , , , , , and . ITC, page 1-9. IEEE Computer Society, (2011)Dynamic channel allocation for higher EDT compression in SoC designs., , , , , and . ITC, page 265-274. IEEE Computer Society, (2010)Clock control architecture and ATPG for reducing pattern count in SoC designs with multiple clock domains., , , and . ITC, page 114-123. IEEE Computer Society, (2010)Realizing High Test Quality Goals with Smart Test Resource Usage., , , , , , , and . ITC, page 525-533. IEEE Computer Society, (2004)Hierarchical Functional-Fault Simulation for High-Level Synthesis., , and . ITC, page 596-605. IEEE Computer Society, (1995)