Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

At-speed scan test with low switching activity.

E. Moghaddam, J. Rajski, S. Reddy, and M. Kassab. VTS, page 177-182. IEEE Computer Society, (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Percilla Moghaddam

Elham Rostamian

Elham Farvili

Elham Farazdaghi

Huschang Elhami

Other publications of authors with the same name

At-speed scan test with low switching activity.E. Moghaddam, J. Rajski, S. Reddy, and M. Kassab. VTS, page 177-182. IEEE Computer Society, (2010)Minimal area test points for deterministic patterns.Y. Liu, E. Moghaddam, N. Mukherjee, S. Reddy, J. Rajski, and J. Tyszer. ITC, page 1-7. IEEE, (2016)An On-Line BIST Technique for Delay Fault Detection in CMOS Circuits.E. Moghaddam, and S. Hessabi. ATS, page 73-78. IEEE, (2007)An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits.E. Moghaddam, and S. Hessabi. DSD, page 619-625. IEEE Computer Society, (2007)Test point insertion in hybrid test compression/LBIST architectures.E. Moghaddam, N. Mukherjee, J. Rajski, J. Tyszer, and J. Zawada. ITC, page 1-10. IEEE, (2016)Embedded Deterministic Test Points.C. Acero, D. Feltham, Y. Liu, E. Moghaddam, N. Mukherjee, M. Patyra, J. Rajski, S. Reddy, J. Tyszer, and J. Zawada. IEEE Trans. Very Large Scale Integr. Syst., 25 (10): 2949-2961 (2017)Test Time and Area Optimized BrST Scheme for Automotive ICs.N. Mukherjee, J. Tyszer, D. Tille, M. Sapati, Y. Liu, J. Mayer, S. Milewski, E. Moghaddam, J. Rajski, and J. Solecki. ITC, page 1-10. IEEE, (2019)Design for low test pattern counts.H. Konuk, E. Moghaddam, N. Mukherjee, J. Rajski, D. Solanki, J. Tyszer, and J. Zawada. DAC, page 136:1-136:6. ACM, (2015)Isometric Test Data Compression.A. Kumar, M. Kassab, E. Moghaddam, N. Mukherjee, J. Rajski, S. Reddy, J. Tyszer, and C. Wang. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 34 (11): 1847-1859 (2015)Time and Area Optimized Testing of Automotive ICs.N. Mukherjee, D. Tille, M. Sapati, Y. Liu, J. Mayer, S. Milewski, E. Moghaddam, J. Rajski, J. Solecki, and J. Tyszer. IEEE Trans. Very Large Scale Integr. Syst., 29 (1): 76-88 (2021)

BibSonomy

Disambiguation of "Moghaddam, Elham K."

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

At-speed scan test with low switching activity.

Please choose a person to relate this publication to

Percilla Moghaddam

Elham Rostamian

Elham Farvili

Elham Farazdaghi

Huschang Elhami

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Moghaddam, Elham K."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML At-speed scan test with low switching activity.

Please choose a person to relate this publication to

Percilla Moghaddam

Elham Rostamian

Elham Farvili

Elham Farazdaghi

Huschang Elhami

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

At-speed scan test with low switching activity.