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Real-time checking of linear control systems using analog checksums., , , and . IOLTS, page 122-127. IEEE, (2013)Memory Distribution: Techniques and Practice for CAD Applications., , and . Parallel Comput., 24 (11): 1597-1615 (1998)Test data compression and test time reduction using an embedded microprocessor., and . IEEE Trans. Very Large Scale Integr. Syst., 11 (5): 853-862 (2003)Delay Defect Diagnosis Methodology Using Path Delay Measurements., , and . IEICE Trans. Electron., 98-C (10): 991-994 (2015)Dedicated Rewriting: Automatic Verification of Low Power Transformations in Register Transfer Level., , and . J. Low Power Electron., 5 (3): 339-353 (2009)Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits., and . IEEE Trans. Circuits Syst. I Regul. Pap., 58-I (8): 1773-1784 (2011)Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems., and . IEEE Trans. Circuits Syst. II Express Briefs, 59-II (11): 785-789 (2012)Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits., and . IEEE Trans. Circuits Syst. II Express Briefs, 61-II (10): 743-747 (2014)A Broadband CMOS RF Front End for Direct Sampling Satellite Receivers., , , and . IEEE J. Solid State Circuits, 54 (8): 2140-2148 (2019)Hierarchical multi-level fault simulation of large systems., , , , and . J. Electron. Test., 1 (2): 139-149 (1990)