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CAS-FEST 2010: Mitigating Variability in Near-Threshold Computing.

M. Seok, G. Chen, S. Hanson, M. Wieckowski, D. Blaauw, и D. Sylvester. IEEE J. Emerg. Sel. Topics Circuits Syst., 1 (1): 42-49 (2011)

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In-Deok Seok

Joon-Weon Seok

Han Seok Seo

Ghil-Seok Yang

Dong-Seok Tschoe

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MemNet: Memory-Efficiency Guided Neural Architecture Search with Augment-Trim learning.P. Liu, B. Wu, H. Ma, P. Chundi, и M. Seok. CoRR, (2019)A Millimeter-Scale Energy-Autonomous Sensor System With Stacked Battery and Solar Cells.M. Fojtik, D. Kim, G. Chen, Y. Lin, D. Fick, J. Park, M. Seok, M. Chen, Z. Foo, D. Blaauw и 1 other автор(ы). IEEE J. Solid State Circuits, 48 (3): 801-813 (2013)Exploring Variability and Performance in a Sub-200-mV Processor.S. Hanson, B. Zhai, M. Seok, B. Cline, K. Zhou, M. Singhal, M. Minuth, J. Olson, L. Nazhandali, T. Austin и 2 other автор(ы). IEEE J. Solid State Circuits, 43 (4): 881-891 (2008)Ultra-Compact and Robust Physically Unclonable Function Based on Voltage-Compensated Proportional-to-Absolute-Temperature Voltage Generators.J. Li, и M. Seok. IEEE J. Solid State Circuits, 51 (9): 2192-2202 (2016)C3SRAM: An In-Memory-Computing SRAM Macro Based on Robust Capacitive Coupling Computing Mechanism.Z. Jiang, S. Yin, J. Seo, и M. Seok. IEEE J. Solid State Circuits, 55 (7): 1888-1897 (2020)A Metastability Risk Prediction and Mitigation Technique for Clock-Domain Crossing With Single-Stage Synchronizer in Near-Threshold-Voltage Multivoltage/ Frequency-Domain Network-on-Chip.C. Lin, W. He, Y. Sun, L. Shao, B. Zhang, J. Yang, и M. Seok. IEEE J. Solid State Circuits, 59 (2): 616-625 (февраля 2024)0.5-1-V, 90-400-mA, Modular, Distributed, 3 × 3 Digital LDOs Based on Event-Driven Control and Domino Sampling and Regulation.S. Kim, D. Kim, Y. Pu, C. Shi, S. Chang, и M. Seok. IEEE J. Solid State Circuits, 56 (9): 2781-2794 (2021)DIMCA: An Area-Efficient Digital In-Memory Computing Macro Featuring Approximate Arithmetic Hardware in 28 nm.C. Lin, D. Wang, B. Zhang, G. Chen, P. Knag, R. Krishnamurthy, и M. Seok. IEEE J. Solid State Circuits, 59 (3): 960-971 (марта 2024)A 0.5V 2.2pW 2-transistor voltage reference.M. Seok, G. Kim, D. Sylvester, и D. Blaauw. CICC, стр. 577-580. IEEE, (2009)High-Capacity Fingerprint Recognition System based on a Dynamic Memory-Capacity Estimation Technique.P. Chundi, A. Sridhar, S. Sarup, и M. Seok. BioCAS, стр. 1-4. IEEE, (2018)

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