Author of the publication

Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown.

, , and . Microelectron. Reliab., 42 (9-11): 1753-1757 (2002)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Estimation of affine transformations directly from tomographic projections in two and three dimensions., , , , and . Mach. Vis. Appl., 24 (2): 419-434 (2013)Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown., , and . Microelectron. Reliab., 42 (9-11): 1753-1757 (2002)Atomically flat single-crystalline gold nanostructures for plasmonic nanocircuitry, , , , , , , , , and 5 other author(s). Nature communications, 1 (9): 150---- (January 2010)A laser-based instrument for measuring strain in electronic packages using coherent fibre-bundles., , , , and . Microelectron. Reliab., 44 (9-11): 1693-1697 (2004)Gallium Artefacts on FIB-milled Silicon Samples., , and . Microelectron. Reliab., 44 (9-11): 1583-1588 (2004)Atomically flat single-crystalline gold nanostructures for plasmonic nanocircuitry, , , , , , , , , and 5 other author(s). Nat Commun, 1 (1): 1-8 (Dec 21, 2010)<a href="https://arxiv.org/abs/1004.1961" style="font-style: normal;">&raquo; arXiv:1004.1961 (2010)</a>.Connection availability analysis of span-restorable mesh networks., , and . Photonic Netw. Commun., 14 (2): 135-148 (2007)