( en | de | ru )

 

Disambiguation of "Ubar, Raimund"

Author of the publication

copydeleteadd this publication to your clipboard
Embedded fault diagnosis in digital systems with BIST.

, , and . Microprocess. Microsystems, 32 (5-6): 279-287 (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Raimund Brigl

Raimund Rütten

Raimund Röthlein

Raimund Pfister

Raimund Walther

 

Other publications of authors with the same name

Functional Built-In Self-Test for processor cores in SoC., , , , and . NORCHIP, page 1-4. IEEE, (2012)On automatic software-based self-test program generation based on high-level decision diagrams., , and . LATS, page 177. IEEE, (2016)Test Generation for Digital Systems Based on Alternative Graphs.. EDCC, volume 852 of Lecture Notes in Computer Science, page 151-164. Springer, (1994)Laboratory framework TEAM for investigating the dependability issues of microprocessor systems., , , and . EWME, page 80-83. IEEE, (2014)Parallel Pseudo-Exhaustive Testing of Array Multipliers with Data-Controlled Segmentation., , and . ISCAS, page 1-5. IEEE, (2018)Parallel X-fault simulation with critical path tracing technique., , , and . DATE, page 879-884. IEEE Computer Society, (2010)Replication-Based Deterministic Testing of 2-Dimensional Arrays with Highly Interrelated Cells., , and . DDECS, page 21-26. IEEE, (2018)Hierarchical Identification of Untestable Faults in Sequential Circuits., , , and . DSD, page 668-671. IEEE Computer Society, (2007)Fault Diagnosis in Integrated Circuits with BIST., , , , and . DSD, page 604-610. IEEE Computer Society, (2007)Representing Gate-Level SET Faults by Multiple SEU Faults at RTL., , , and . CoRR, (2021)