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PADLOC: Physically-Aware Defect Localization and Characterization.

, and . ATS, page 212-218. IEEE Computer Society, (2017)

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Extracting Defect Density and Size Distributions from Product ICs., , , , , , , and . IEEE Des. Test Comput., 23 (5): 390-400 (2006)Diagnosis Outcome Preview through Learning., , , and . VTS, page 1-6. IEEE, (2019)Hierarchical Design and Test of Integrated Microsystems., , and . IEEE Des. Test Comput., 16 (4): 18-27 (1999)Multiple-detect ATPG based on physical neighborhoods., , , and . DAC, page 1099-1102. ACM, (2006)Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle., , , and . VTS, page 1-6. IEEE, (2019)Secuirty Metrics for Logic Circuits., , and . HOST, page 53-56. IEEE, (2022)Built-In Self Test of CMOS-MEMS Accelerometers., and . ITC, page 1075-1084. IEEE Computer Society, (2002)Progressive Bridge Identification., , and . ITC, page 309-318. IEEE Computer Society, (2003)Superscalar Processor Validation at the Microarchitecture Level., , and . VLSI Design, page 300-305. IEEE Computer Society, (1999)Extraction of defect density and size distributions from wafer sort test results., , , , , , and . DATE, page 913-918. European Design and Automation Association, Leuven, Belgium, (2006)