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Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells., , and . ITC, page 390-399. IEEE Computer Society, (1984)Interconnect characteristics of 2.5-D system integration scheme., and . ISPD, page 171-175. ACM, (2001)Improving the Quality of Test Education.. ITC, page 1119. IEEE Computer Society, (1991)Prospects for WSI: A Manufacturing Perspective.. Computer, 25 (4): 58-65 (1992)Fault Tuples in Diagnosis of Deep-Submicron Circuits., , , , , and . ITC, page 233-241. IEEE Computer Society, (2002)2.5D system integration: a design driven system implementation schema., and . ASP-DAC, page 450-455. IEEE Computer Society, (2004)Modeling the Difficulty of Sequential Automatic Test Pattern Generation., and . ICCD, page 261-271. IEEE Computer Society, (1996)On Test Set Preservation of Retimed Circuits., , , and . DAC, page 176-182. ACM Press, (1995)Process Monitoring Oriented IC Testing., and . ITC, page 527-532. IEEE Computer Society, (1989)Improved Yield Model for Submicron Domain., and . DFT, page 2-10. IEEE Computer Society, (1997)