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An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

X. Wang, T. Gu, C. Yan, X. Wu, F. Yang, S. Wang, D. Zhou, and X. Zeng. DAC, page 1-6. IEEE, (2020)

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Jinglan Wu

Recovery of citric acid from fermentation broth using simulated moving bed technology: = Reinigung von Zitronensäure aus Fermentationslösung durch kontinuierliche ChromatographieJ. Wu. Uni Erlangen-Nürnberg, (2009)

Changzhu Wu

Jinjin Wu

Yinghua Wu

Haiyan Wu

Other publications of authors with the same name

A 9T-SRAM in-memory computing macro for Boolean logic and multiply-and-accumulate operations.C. Dai, Z. Ren, L. Guan, H. Liu, M. Gao, W. Lu, Z. Pang, C. Peng, and X. Wu. Microelectron. J., (February 2024)Design of radiation-hardened memory cell by polar design for space applications.L. Hao, L. Liu, Q. Shi, B. Qiang, Z. Li, N. Liu, C. Dai, Q. Zhao, C. Peng, W. Lu and 2 other author(s). Microelectron. J., (February 2023)An offset cancellation technique for SRAM sense amplifier based on relation of the delay and offset.Y. Zhao, J. Wang, Z. Tong, X. Wu, C. Peng, W. Lu, Q. Zhao, and Z. Lin. Microelectron. J., (2022)Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies.L. Hao, X. Zhang, C. Dai, Q. Zhao, W. Lu, C. Peng, Y. Zhou, Z. Lin, and X. Wu. IEEE Trans. Very Large Scale Integr. Syst., 32 (4): 597-608 (April 2024)Offset-Compensation High-Performance Sense Amplifier for Low-Voltage DRAM Based on Current Mirror and Switching Point.P. Huang, K. Chang, J. Ge, C. Peng, X. Wu, J. Chen, and Z. Lin. IEEE Trans. Circuits Syst. II Express Briefs, 69 (4): 2011-2015 (2022)In-Memory Multibit Multiplication Based on Bitline Shifting.J. Zhang, Z. Lin, X. Wu, Z. Tong, C. Peng, W. Lu, Q. Zhao, H. Wu, and J. Chen. IEEE Trans. Circuits Syst. II Express Briefs, 69 (2): 354-358 (2022)Radiation-hardened 14T SRAM cell by polar design for space applications.L. Hao, B. Qiang, C. Dai, C. Peng, W. Lu, Z. Lin, L. Liu, Q. Zhao, X. Wu, and F. Sun. IEICE Electron. Express, 20 (13): 20230083 (2023)Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD.X. Zhao, H. Sun, L. Liu, Y. Yang, L. Dai, X. Wu, R. Zhang, J. Wang, and N. Zheng. IEEE Trans. Circuits Syst. I Regul. Pap., 66-I (1): 226-238 (2019)Read/write margin enhanced 10T SRAM for low voltage application.C. Peng, L. Guan, W. Lu, X. Wu, and X. Ji. IEICE Electron. Express, 13 (12): 20160382 (2016)Novel radiation-hardened-by-design (RHBD) 14T memory cell for aerospace applications in 65 nm CMOS technology.P. Li, X. Wang, Y. Zhang, H. Wang, J. Lu, Q. Zhao, L. Hao, C. Peng, W. Lu, Z. Lin and 1 other author(s). Microelectron. J., (November 2023)

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Disambiguation of "Wu, Xiulong"

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An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

Please choose a person to relate this publication to

Jinglan Wu

Changzhu Wu

Jinjin Wu

Yinghua Wu

Haiyan Wu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wu, Xiulong"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

Please choose a person to relate this publication to

Jinglan Wu

Changzhu Wu

Jinjin Wu

Yinghua Wu

Haiyan Wu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
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APA
Chicago
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An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.