( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Test solution for data retention faults in low-power SRAMs.

, , , , , , и . DATE, стр. 442-447. EDA Consortium San Jose, CA, USA / ACM DL, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Nabil Motosh

Nabil Irshaid

Nabil Sayed

Nabil Allam

Nabil Aboulkhair

 

Другие публикации лиц с тем же именем

Detecting NBTI induced failures in SRAM core-cells., , , , , , и . VTS, стр. 75-80. IEEE Computer Society, (2010)On the Test and Mitigation of Malfunctions in Low-Power SRAMs., , , , , и . J. Electron. Test., 30 (5): 611-627 (2014)Test solution for data retention faults in low-power SRAMs., , , , , , и . DATE, стр. 442-447. EDA Consortium San Jose, CA, USA / ACM DL, (2013)A statistical simulation method for reliability analysis of SRAM core-cells., , , , , , и . DAC, стр. 853-856. ACM, (2010)Impact of Resistive-Bridging Defects in SRAM Core-Cell., , , , , , и . DELTA, стр. 265-269. IEEE Computer Society, (2010)Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures., , , , , , и . DTIS, стр. 39-44. IEEE, (2013)Analyzing resistive-open defects in SRAM core-cell under the effect of process variability., , , , , , и . ETS, стр. 1-6. IEEE Computer Society, (2013)Setting test conditions for improving SRAM reliability., , , , , , и . European Test Symposium, стр. 257. IEEE Computer Society, (2010)On using address scrambling to implement defect tolerance in SRAMs., , , , , , и . ITC, стр. 1-8. IEEE Computer Society, (2011)On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs., , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2013)