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ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits.

, , , , , и . IEEE Des. Test, 35 (3): 24-30 (2018)

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Ronny Leuschner

Reaktionsmechanismen von Legierungselementen beim rekristallisierenden Glühen zur Schmelztauchveredelung von Mehrphasenstählen. TU Aachen, (2007)

Ronny Sutarto

EuO and Gd-doped EuO thin films: epitaxial growth and properties. Uni Köln, (2009)

Ronny Kaden

Ronny Baierl

Ronny Westerman

 

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Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis., , , , и . ITC, стр. 1-10. IEEE, (2016)ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits., , , , , и . IEEE Des. Test, 35 (3): 24-30 (2018)Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (октября 2023)Automatic generation of autonomous built-in observability structures for analog circuits., , , , и . ETS, стр. 1-6. IEEE, (2015)Automatic testing of analog ICs for latent defects using topology modification., , , , , и . ETS, стр. 1-6. IEEE, (2017)Effective DC fault models and testing approach for open defects in analog circuits., , , , и . ITC, стр. 1-9. IEEE, (2016)Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs., , , , , , и . ITC, стр. 1-4. IEEE, (2019)A very low cost and highly parallel DfT method for analog and mixed-signal circuits., , , , , и . ETS, стр. 1-2. IEEE, (2017)Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing., , , , , и . ETS, стр. 1-6. IEEE, (2020)Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics., , , , , , , и . ETS, стр. 1-6. IEEE, (2020)