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Disambiguation of "Dobbelaere, Wim"

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ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits.

, , , , , and . IEEE Des. Test, 35 (3): 24-30 (2018)

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Wim Wätjen

Wim Lutzke

Wim Broekaert

Wim Damen

Wim Beyers

 

Other publications of authors with the same name

Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis., , , , and . ITC, page 1-10. IEEE, (2016)ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits., , , , , and . IEEE Des. Test, 35 (3): 24-30 (2018)Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (October 2023)Innovative Practices on Automotive Test., , and . VTS, page 1. IEEE, (2019)Automatic generation of autonomous built-in observability structures for analog circuits., , , , and . ETS, page 1-6. IEEE, (2015)Automatic testing of analog ICs for latent defects using topology modification., , , , , and . ETS, page 1-6. IEEE, (2017)Analog fault coverage improvement using final-test dynamic part average testing., , , , , , and . ITC, page 1-9. IEEE, (2016)Innovative practices on quality levels of A/MS devices., , , , and . VTS, page 1. IEEE Computer Society, (2018)Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems., , , , , and . ISCAS, page 1-4. IEEE, (2018)Design and test of analog circuits towards sub-ppm level., , , , and . ITC, page 1-2. IEEE Computer Society, (2014)