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Disambiguation of "Esen, Baris"

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ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits.

, , , , , and . IEEE Des. Test, 35 (3): 24-30 (2018)

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Hasan Esen

Baris Yanik

Baris Ünver

Caroline Barisch

Volkan Esen

 

Other publications of authors with the same name

Automatic generation of autonomous built-in observability structures for analog circuits., , , , and . ETS, page 1-6. IEEE, (2015)Automatic testing of analog ICs for latent defects using topology modification., , , , , and . ETS, page 1-6. IEEE, (2017)Effective DC fault models and testing approach for open defects in analog circuits., , , , and . ITC, page 1-9. IEEE, (2016)A very low cost and highly parallel DfT method for analog and mixed-signal circuits., , , , , and . ETS, page 1-2. IEEE, (2017)An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes., , , , , and . IEEE Des. Test, 35 (3): 15-23 (2018)Non-intrusive detection of defects in mixed-signal integrated circuits using light activation., , , , , and . ITC, page 1-7. IEEE, (2017)Automated testing of mixed-signal integrated circuits by topology modification., , , , and . VTS, page 1-6. IEEE Computer Society, (2015)Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis., , , , and . ITC, page 1-10. IEEE, (2016)ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits., , , , , and . IEEE Des. Test, 35 (3): 24-30 (2018)Analog fault coverage improvement using final-test dynamic part average testing., , , , , , and . ITC, page 1-9. IEEE, (2016)