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Improving the Test of NoC-Based SoCs with Help of Compression Schemes.

, , , and . ISVLSI, page 139-144. IEEE Computer Society, (2008)

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SECCS: SECure Context Saving for IoT Devices., , , , , and . CoRR, (2019)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Experimentations on scan chain encryption with PRESENT., , , and . IVSW, page 45-50. IEEE, (2017)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electron. Test., 29 (3): 331-340 (2013)Operators allocation in the silicon compiler SCOOP., , and . Integr., 8 (2): 99-109 (1989)Improving the Test of NoC-Based SoCs with Help of Compression Schemes., , , and . ISVLSI, page 139-144. IEEE Computer Society, (2008)New security threats against chips containing scan chain structures., , , and . HOST, page 110. IEEE Computer Society, (2011)Alleviating DFT Cost Using Testability Driven HLS., , and . Asian Test Symposium, page 46-51. IEEE Computer Society, (1998)