( en | de | ru )

 

Disambiguation of "Czernohorsky, Malte"

Author of the publication

copydeleteadd this publication to your clipboard
Gate Stack Optimization Toward Disturb-Free Operation of Ferroelectric HSO based FeFET for NAND Applications.

, , , , , , , , , , and . NVMTS, page 1-4. IEEE, (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Malte Czernohorsky

Olf Czernohorsky

Georg Malterer

Ruth Malter

Thomas Malter

 

Other publications of authors with the same name

Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells., , , , , , , , , and 9 other author(s). IRPS, page 1-9. IEEE, (2020)Piezoelectric response of polycrystalline silicon‐doped hafnium oxide thin films determined by rapid temperature cycles, , , , , , , , and . Adv. Electron. Mater., 6 (3): 1901015 (Jan 29, 2020)CMOS Compatible Pyroelectric Applications Enabled by Doped HfO2 Films on Deep-Trench Structures., , , , , and . ESSDERC, page 130-133. IEEE, (2018)Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions., , , , , , , , , and 5 other author(s). IRPS, page 11-1. IEEE, (2022)Enablement of CMOS integrated sensor, harvesting and storage applications by ferroelectric HfO2., , and . ICICDT, page 84-87. IEEE, (2022)Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability., , , , , , , , , and 7 other author(s). IMW, page 1-4. IEEE, (2022)BEoL Reliability, XPS and REELS Study on low-k Dielectrics to understand Breakdown Mechanisms., , , , , , , , , and . IRPS, page 1-5. IEEE, (2020)Gate Stack Optimization Toward Disturb-Free Operation of Ferroelectric HSO based FeFET for NAND Applications., , , , , , , , , and 1 other author(s). NVMTS, page 1-4. IEEE, (2019)