Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

In-line metrology and inspection for process control during 3D stacking of IC's.

S. Halder, I. Wolf, A. Phommahaxay, A. Miller, M. Maenhoudt, G. Beyer, B. Swinnen, and E. Beyne. 3DIC, page 1-4. IEEE, (2011)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Dhomse

Other publications of authors with the same name

YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach.E. Dehaerne, B. Dey, H. Esfandiar, L. Verstraete, H. Suh, S. Halder, and S. Gendt. CoRR, (2023)A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation.E. Dehaerne, B. Dey, S. Halder, and S. Gendt. CoRR, (2023)Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review.T. Lechien, E. Dehaerne, B. Dey, V. Blanco, S. Halder, and S. Gendt. CoRR, (2023)Deep Learning-Based Defect Classification and Detection in SEM Images.B. Dey, D. Goswami, S. Halder, K. Khalil, P. Leray, and M. Bayoumi. CoRR, (2022)SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation.V. Ridder, B. Dey, S. Halder, and B. Waeyenberge. CoRR, (2023)A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection.E. Dehaerne, B. Dey, and S. Halder. ICECS 2022, page 1-2. IEEE, (2022)Using Unsupervised Machine Learning for Plasma Etching Endpoint Detection.I. Chakroun, T. Ashby, S. Das, S. Halder, R. Wuyts, and W. Verachtert. ICPRAM, page 273-279. SCITEPRESS, (2020)SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering.M. Hwang, B. Dey, E. Dehaerne, S. Halder, and Y. han Shin. CoRR, (2023)SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection.V. Ridder, B. Dey, E. Dehaerne, S. Halder, S. Gendt, and B. Waeyenberge. CoRR, (2023)Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.V. Ridder, B. Dey, V. Blanco, S. Halder, and B. Waeyenberge. CoRR, (2023)

BibSonomy

Disambiguation of "Halder, Sandip"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

In-line metrology and inspection for process control during 3D stacking of IC's.

Please choose a person to relate this publication to

Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Dhomse

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Halder, Sandip"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML In-line metrology and inspection for process control during 3D stacking of IC's.

Please choose a person to relate this publication to

Sandip Halder

Sandip Agarwala

Sandip Murarka

Sandip Roy

Sandip Dhomse

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

In-line metrology and inspection for process control during 3D stacking of IC's.