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CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.

H. Furukawa, X. Wen, K. Miyase, Y. Yamato, S. Kajihara, P. Girard, L. Wang, and M. Tehranipoor. ATS, page 397-402. IEEE Computer Society, (2008)

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Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)Energy Model based Control for Forming Processes.P. Girard, and V. Thomson. ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation.N. Guibert, L. Guittet, and P. Girard. IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications.A. Yan, Z. Wu, J. Zhou, Y. Hu, Y. Chen, Z. Ying, X. Wen, and P. Girard. ATS, page 55-60. IEEE, (2019)From onions to broccoli: generalizing Lewis' counterfactual logic.P. Girard. J. Appl. Non Class. Logics, 17 (2): 213-229 (2007)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)Fast Bridging Fault Diagnosis using Logic Information.A. Rousset, A. Bosio, P. Girard, C. Landrault, S. Pravossoudovitch, and A. Virazel. ATS, page 33-38. IEEE, (2007)

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Disambiguation of "Girard, Patrick"

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CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.