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CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.

H. Furukawa, X. Wen, K. Miyase, Y. Yamato, S. Kajihara, P. Girard, L. Wang, и M. Tehranipoor. ATS, стр. 397-402. IEEE Computer Society, (2008)

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Andy Ch Laungani

Harn-Jing Terng

Terng-Yaw Lin

Wang Wang

Linfang Wang

Investigation of the functions of 53BP1 in DNA demethylationL. Wang. Uni Marburg, (2009)

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