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Disambiguation of "Shinohara, Hirofumi"

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Increase of Crosstalk Noise Due to Imbalanced Threshold Voltage Between nMOS and pMOS in Subthreshold Logic Circuits.

, , , , , and . IEEE J. Solid State Circuits, 48 (8): 1986-1994 (2013)

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Kenichi Shinohara

Hirofumi Ishihara

Hirofumi Hosokawa

Hirofumi Ueda

Hirofumi Kumazawa

 

Other publications of authors with the same name

A 0.116 pJ/bit Latch-Based True Random Number Generator Featuring Static Inverter Selection and Noise Enhancement., , , and . IEEE Trans. Very Large Scale Integr. Syst., 32 (3): 564-572 (March 2024)A 64-bit carry look ahead adder using pass transistor BiCMOS gates., , , , and . IEEE J. Solid State Circuits, 31 (6): 810-818 (1996)Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology., , , , , and . ISLPED, page 15-20. ACM, (2008)12% Power reduction by within-functional-block fine-grained adaptive dual supply voltage control in logic circuits with 42 voltage domains., , , , , and . ESSCIRC, page 191-194. IEEE, (2011)A 65-nm SoC Embedded 6T-SRAM Designed for Manufacturability With Read and Write Operation Stabilizing Circuits., , , , , , , , , and 6 other author(s). IEEE J. Solid State Circuits, 42 (4): 820-829 (2007)A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement., , , , , and . VLSI-DAT, page 1-4. IEEE, (2022)Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability., , , , , , , , and . ICCAD, page 398-405. IEEE Computer Society, (2005)A BiCMOS wired-OR logic., , , , and . IEEE J. Solid State Circuits, 30 (6): 622-628 (June 1995)60% Cycle time acceleration, 55% energy reduction, 32Kbit SRAM by auto-selective boost (ASB) scheme for slow memory cells in random variations., , , , , and . ESSCIRC, page 317-320. IEEE, (2012)Accurate Nanopower Supply-Insensitive CMOS Unit Vth Extractor and αVth Extractor with Continuous Variety., , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 100-A (5): 1145-1155 (2017)