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Special session: Hot topics: Statistical test methods., , , , , и . VTS, стр. 1-2. IEEE Computer Society, (2015)Exploiting path delay test generation to develop better TDF tests for small delay defects., , , и . ITC, стр. 1-10. IEEE, (2017)Test application time minimization for RAS using basis optimization of column decoder., , , , и . ISCAS, стр. 2614-2617. IEEE, (2010)Timing Variation Adaptive Pipeline Design: Using Probabilistic Activity Completion Sensing with Backup Error Resilience., , , , и . VLSID, стр. 122-127. IEEE Computer Society, (2014)An Efficient Transition Detector Exploiting Charge Sharing., и . VLSID, стр. 298-303. IEEE Computer Society, (2015)Silent Data Errors: Sources, Detection, and Modeling., , , и . VTS, стр. 1-12. IEEE, (2023)Delay Test Scan Flip-Flop: DFT for High Coverage Delay Testing., и . VLSI Design, стр. 763-768. IEEE Computer Society, (2007)A High Throughput Multiplier Design Exploiting Input Based Statistical Distribution in Completion Delays., , , и . VLSI Design, стр. 109-114. IEEE Computer Society, (2013)Path Delay Tuning for Performance Gain in the Face of Random Manufacturing Variations., , и . VLSI Design, стр. 382-388. IEEE Computer Society, (2011)Scan based two-pattern tests: should they target opens instead of TDFs?. LATS, стр. 1-2. IEEE Computer Society, (2015)