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COVID-19 Time Series Prediction.

, , and . CENTERIS/ProjMAN/HCist, volume 181 of Procedia Computer Science, page 973-980. Elsevier, (2020)

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On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits., , , and . DFT, page 263-270. IEEE Computer Society, (1994)Investigating the Use of BICS to detect resistive-open defects in SRAMs., , , , , , and . IOLTS, page 200-201. IEEE Computer Society, (2010)Aging-Aware Power or Frequency Tuning With Predictive Fault Detection., , , , , , , , and . IEEE Des. Test Comput., 29 (5): 27-36 (2012)On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level., , , , , and . J. Electron. Test., 20 (4): 345-355 (2004)RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage., , , and . J. Electron. Test., 18 (2): 179-187 (2002)Low Power BIST by Filtering Non-Detecting Vectors., , , , , , , , , and . J. Electron. Test., 16 (3): 193-202 (2000)Low power BIST by filtering non-detecting vectors., , , , , , , , , and . ETW, page 165-170. IEEE Computer Society, (1999)Fault Modeling and Defect Level Projections in Digital ICs., , , and . EDAC-ETC-EUROASIC, page 436-442. IEEE Computer Society, (1994)MOSYS A Methodology for Automatic Object Identification from System Specification., , , , and . ISORC, page 198-201. IEEE Computer Society, (2000)Automatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels., , , , , , , , and . ISCAS, page 1185-1188. IEEE, (2010)