( en | de | ru )

 

Disambiguation of "Bernardi, Paolo"

Author of the publication

copydeleteadd this publication to your clipboard
Increasing fault coverage during functional test in the operational phase.

, , , , and . IOLTS, page 43-48. IEEE, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Markus Bernardi

Giordano Paolo

Andreas Bernardi

Mirko Bernardi

Mariangela Bernardi

 

Other publications of authors with the same name

A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , and 11 other author(s). IOLTS, page 1-10. IEEE, (2022)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , and . DFT, page 1-6. IEEE, (2022)Test Considerations about the Structured ASIC Paradigm., and . DDECS, page 232-233. IEEE Computer Society, (2006)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , and . VTS, page 1-7. IEEE, (2023)A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions., , , , , and . VTS, page 389-394. IEEE Computer Society, (2008)Scan-chain intra-cell defects grading., , , , , , and . DTIS, page 1-6. IEEE, (2015)On the in-field testing of spare modules in automotive microprocessors., , , , , and . VLSI-SoC, page 1-6. IEEE, (2017)Cumulative embedded memory failure bitmap display & analysis., , , , , , , and . DDECS, page 255-260. IEEE Computer Society, (2010)