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A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.

, , , , and . ITC, page 424-432. IEEE Computer Society, (1997)

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Test Development for Second-Generation ColdFire Microprocessors., , , , and . IEEE Des. Test Comput., 15 (3): 70-76 (1998)BA-BIST: Board test from inside the IC out., and . ITC, page 1. IEEE Computer Society, (2013)Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox., , , , , and . ITC, page 1-10. IEEE Computer Society, (2012)Optimization trade-offs for vector volume and test power., and . ITC, page 873-881. IEEE Computer Society, (2000)Processing High Volume Scan Test Results for Yield Learning., , and . ISQED, page 293-298. IEEE Computer Society, (2007)Detecting a trojan die in 3D stacked integrated circuits., , , , , and . NATW, page 1-6. IEEE, (2017)A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats., and . IEEE Instrum. Meas. Mag., 23 (5): 27-32 (2020)3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations., , , , , and . IEEE Trans. Emerg. Top. Comput., 9 (2): 774-786 (2021)IEEE P1687.1: Extending the Network Boundaries for Test., , , , , , , and . ITC, page 382-390. IEEE, (2022)A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors., , , , and . ITC, page 424-432. IEEE Computer Society, (1997)