( en | de | ru )

 

Disambiguation of "Takahashi, Hiroshi"

Author of the publication

copydeleteadd this publication to your clipboard
Development of Hierarchical Optical Path Cross-Connect Systems Employing Wavelength/Waveband Selective Switches.

, , , , , , and . JOCN, 3 (7): 559-567 (2011)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Teruaki Takahashi

Hiroshi Kawabe

Hiroshi Murata

Akeshi Takahashi

Kotaro Takahashi

 

Other publications of authors with the same name

A 1/4-inch 8Mpixel back-illuminated stacked CMOS image sensor., , , , , , , , , and 6 other author(s). ISSCC, page 484-485. IEEE, (2013)A Study on Visual Driving Simulator for Analyzing Perception Characteristics of a Driver., and . SCIS&ISIS, page 672-677. IEEE, (2018)An Analysis of the Influence of dispersion of Valuations on Financial Markets through Agent-Based Modeling.. Int. J. Inf. Technol. Decis. Mak., 11 (1): 143-166 (2012)Learning a selection problem of investment projects and capital structure through business game., , and . Intell. Decis. Technol., 4 (2): 159-167 (2010)Physical Power Evaluation of Low Power Logic-BIST Scheme Using Test Element Group Chip., , , and . J. Low Power Electron., 11 (4): 528-540 (2015)A 60 GHz Hybrid Analog/Digital Beamforming Receiver with Interference Suppression for Multiuser Gigabit/s Radio Access., , , , , , , , , and 2 other author(s). IEICE Trans. Electron., 99-C (7): 856-865 (2016)Applications of Fuzzy Control to Automobiles.. J. Robotics Mechatronics, 7 (1): 9-11 (1995)A Preliminary Study on the Handling of a Robotic Arm Based only on Temporarily Provided Auditory Information as a Substitute for Visual Information.. J. Robotics Mechatronics, 29 (2): 406-418 (2017)Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment., , , and . IEICE Trans. Inf. Syst., 96-D (6): 1323-1331 (2013)Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools., , , , and . IEICE Trans. Inf. Syst., 91-D (3): 690-699 (2008)