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Networking industry trends in ESD protection for high speed IOs.

R. Wong, R. Fung, and S. Wen. ASICON, page 1-4. IEEE, (2013)

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Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Ding

Jie Huang

Other publications of authors with the same name

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.L. Xu, J. Cao, J. Brockman, C. Cazzaniga, C. Frost, S. Wen, R. Fung, and B. Bhuva. IRPS, page 1-5. IEEE, (2020)Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms.N. Jing, J. Lee, Z. Feng, W. He, Z. Mao, S. Wen, R. Wong, and L. He. FPL, page 282-285. IEEE Computer Society, (2011)Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.Y. Ren, S. Shi, L. Chen, H. Wang, L. Gao, G. Guo, S. Wen, R. Wong, and N. van Vonno. J. Electron. Test., 29 (4): 609-616 (2013)Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.Y. Ren, A. He, S. Shi, G. Guo, L. Chen, S. Wen, R. Wong, N. van Vonno, and B. Bhuva. J. Electron. Test., 30 (1): 149-154 (2014)A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning.S. Kundu, M. Liu, R. Wong, S. Wen, and C. Kim. ISSCC, page 308-310. IEEE, (2018)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.J. Cao, L. Xu, B. Bhuva, S. Wen, R. Wong, B. Narasimham, and L. Massengill. IRPS, page 1-5. IEEE, (2019)Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components.H. Oh, M. Chun, J. Lee, S. Wen, N. Yu, B. Park, and S. Baeg. IRPS, page 1-6. IEEE, (2023)Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.Y. Xiong, A. Feeley, L. Massengill, B. Bhuva, S. Wen, and R. Fung. IRPS, page 1-5. IEEE, (2021)Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations.C. Jung, S. Baeg, S. Wen, and R. Wong. ISQED, page 390-397. IEEE, (2011)Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.G. Bak, S. Lee, H. Lee, K. Park, S. Baeg, S. Wen, R. Wong, and C. Slayman. IRPS, page 3. IEEE, (2015)

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Disambiguation of "Wen, Shi-Jie"

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Networking industry trends in ESD protection for high speed IOs.

Please choose a person to relate this publication to

Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Ding

Jie Huang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wen, Shi-Jie"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Networking industry trends in ESD protection for high speed IOs.

Please choose a person to relate this publication to

Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Ding

Jie Huang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Networking industry trends in ESD protection for high speed IOs.