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Disambiguation of "Meneghesso, Gaudenzio"

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Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism.

, , , , , and . Microelectron. Reliab., 50 (9-11): 1599-1603 (2010)

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Other publications of authors with the same name

Effects of constant voltage stress on organic complementary logic inverters., , , , , , , and . ESSDERC, page 298-301. IEEE, (2014)Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism., , , , , and . Microelectron. Reliab., 50 (9-11): 1599-1603 (2010)Full Optical Contactless Thermometry Based on LED Photoluminescence., , , , , , , and . IEEE Trans. Instrum. Meas., (2021)Study on the difference between ID(VG) and C(VG) pBTI shifts in GaN-on-Si E-mode MOSc-HEMT., , , , , , , , , and 6 other author(s). IRPS, page 1-8. IEEE, (2021)Reliability Investigation of GaN HEMTs for MMICs Applications., , , , and . Micromachines, 5 (3): 570-582 (2014)Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage., , , , , , , , , and 2 other author(s). Microelectron. Reliab., 54 (9-10): 2147-2150 (2014)High brightness GaN LEDs degradation during dc and pulsed stress., , , , , , , and . Microelectron. Reliab., 46 (9-11): 1720-1724 (2006)Long Term Stability of InGaAs/AlInAs/GaAs Methamorphic HEMTs., , and . Microelectron. Reliab., 41 (9-10): 1579-1584 (2001)Reliability analysis of InGaN Blu-Ray laser diode., , , , , , , and . Microelectron. Reliab., 49 (9-11): 1236-1239 (2009)Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors., , , , , , , , , and . IRPS, page 1-5. IEEE, (2020)