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A Wide Range Spatial Frequency Analysis of Intra-Die Variations with 4-mm 4000 × 1 Transistor Arrays in 90nm CMOS.

, , , и . CICC, стр. 257-260. IEEE, (2007)

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Yoriko Sakurai

Kaneaki Sakurai

Takayasu Shimizu

Miriam Takayasu

 

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