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Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)Test Considerations about the Structured ASIC Paradigm., and . DDECS, page 232-233. IEEE Computer Society, (2006)A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)Scan-chain intra-cell defects grading., , , , , , and . DTIS, page 1-6. IEEE, (2015)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , and 11 other author(s). IOLTS, page 1-10. IEEE, (2022)On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores., , , and . ETS, page 179-184. IEEE Computer Society, (2007)A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions., , , , , and . VTS, page 389-394. IEEE Computer Society, (2008)Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs., , , , , and . VLSI-SoC (Selected Papers), volume 508 of IFIP Advances in Information and Communication Technology, page 130-151. Springer, (2016)SW-based transparent in-field memory testing., , , and . LATS, page 1-6. IEEE Computer Society, (2015)On the in-field testing of spare modules in automotive microprocessors., , , , , and . VLSI-SoC, page 1-6. IEEE, (2017)