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An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.

, , , , , , and . ETS, page 1-6. IEEE, (2022)

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Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , and . DFT, page 1-6. IEEE, (2022)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , and . VTS, page 1-7. IEEE, (2023)A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress., , , , , , , , , and 1 other author(s). IEEE Trans. Computers, 72 (5): 1447-1459 (May 2023)A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips., , , , , , , and . IEEE Access, (2023)On the integration and hardening of Software Test Libraries in Real-Time Operating Systems., , , , , , , and . LATS, page 1-6. IEEE, (2023)An innovative Strategy to Quickly Grade Functional Test Programs., , , , , , , , , and . ITC, page 355-364. IEEE, (2022)An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip., , , , , , and . ETS, page 1-6. IEEE, (2022)Test, Reliability and Functional Safety Trends for Automotive System-on-Chip., , , , , , , , , and 14 other author(s). ETS, page 1-10. IEEE, (2022)A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip., , , , , , and . LATS, page 1-6. IEEE, (2022)